Electrical interconnections
Modelization and simulation of interconnections


     The following articles describe a calculation method for high-frequency resistive losses in multiconductor interconnections, and a guaranteed passive model for the per-unit-length internal impedance matrix.

[B83] F. Broydé, E. Clavelier, "A simple computation of the high-frequency per-unit-length resistance matrix", Proceedings of the 15th IEEE Workshop on Signal Propagation on Interconnects, SPI 2011, Naples, May 8-11, 2011, pp. 121-124.

[B85] F. Broydé, E. Clavelier, "A Passive Analytical Per-Unit-Length Internal Impedance Matrix Model for Multiconductor Interconnections", Proc. of the 2011 IEEE Int. Symp. on Electromagnetic Compatibility, EMC 2011, Long Beach, USA, August 14-19, 2011, Vol. 3, pp. 877-882.

[B87] F. Broydé, E. Clavelier, "A Computation of the High-Frequency Per-Unit-Length Resistance Matrix of a Multiconductor Interconnection", Proc. of the 10th Int. Symp. on Electromagnetic Compatibility, EMC Europe 2011, York, UK, pp. 351-356, September 26-30, 2011.

[B88] F. Broydé, E. Clavelier, "An Analytical Resistive Loss Model for Multiconductor Transmission Lines and the Proof of its Passivity", Proc. IEEE 20th Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2011, San Jose, USA, pp. 119-122, Oct. 23-26, 2011.

     The following article describes a calculation method for the direct current per-unit-length inductance matrix. This method is intended to be integrated in the per-unit-length internal impedance matrix model.

[B92] F. Broydé, E. Clavelier, L. Broydé, "A Direct Current Per-Unit-Length Inductance Matrix Computation Using Modified Partial Inductances", Proc. of the CEM 2012 Int. Symp. on Electromagnetic Compatibility (16ème colloque international sur la compatibilité électromagnétique - CEM 2012), Rouen, France, April 2012, session 2C.

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